AJDRAJNR - American Journal of Neuroradiology

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American Journal of Neuroradiology, Vol 14, Issue 2 497-500, Copyright © 1993 by American Society of Neuroradiology

ARTICLES

Temperature changes in nickel-chromium intracranial depth electrodes during MR scanning

J Zhang, CL Wilson, MF Levesque, EJ Behnke and RB Lufkin
Brain Research Institute, UCLA 90024.

The authors sought to determine whether there are any heating effects of 1.5-T MR scanning upon nickel-chromium electrodes and to confirm the safety of scanning these electrodes after intracranial surgical implantation in epilepsy patients. Since there was no significant temperature increase of the electrodes tested in their experiments, the authors conclude that nickel-chromium electrodes implanted in the brain are thermally safe for MR scanning.




Copyright © 2008 by the American Society of Neuroradiology. Print ISSN: 0195-6108 Online ISSN: 1936-959X