TY - JOUR T1 - Temperature changes in nickel-chromium intracranial depth electrodes during MR scanning. JF - American Journal of Neuroradiology JO - Am. J. Neuroradiol. SP - 497 LP - 500 VL - 14 IS - 2 AU - J Zhang AU - C L Wilson AU - M F Levesque AU - E J Behnke AU - R B Lufkin Y1 - 1993/03/01 UR - http://www.ajnr.org/content/14/2/497.abstract N2 - The authors sought to determine whether there are any heating effects of 1.5-T MR scanning upon nickel-chromium electrodes and to confirm the safety of scanning these electrodes after intracranial surgical implantation in epilepsy patients. Since there was no significant temperature increase of the electrodes tested in their experiments, the authors conclude that nickel-chromium electrodes implanted in the brain are thermally safe for MR scanning. ER -