PT  - JOURNAL ARTICLE
AU  - Zhang, J
AU  - Wilson, C L
AU  - Levesque, M F
AU  - Behnke, E J
AU  - Lufkin, R B
TI  - Temperature changes in nickel-chromium intracranial depth electrodes during MR scanning.
DP  - 1993 Mar 01
TA  - American Journal of Neuroradiology
PG  - 497--500
VI  - 14
IP  - 2
4099  - http://www.ajnr.org/content/14/2/497.short
4100  - http://www.ajnr.org/content/14/2/497.full
SO  - Am. J. Neuroradiol.1993 Mar 01; 14
AB  - The authors sought to determine whether there are any heating effects of 1.5-T MR scanning upon nickel-chromium electrodes and to confirm the safety of scanning these electrodes after intracranial surgical implantation in epilepsy patients. Since there was no significant temperature increase of the electrodes tested in their experiments, the authors conclude that nickel-chromium electrodes implanted in the brain are thermally safe for MR scanning.