PT - JOURNAL ARTICLE AU - J Zhang AU - C L Wilson AU - M F Levesque AU - E J Behnke AU - R B Lufkin TI - Temperature changes in nickel-chromium intracranial depth electrodes during MR scanning. DP - 1993 Mar 01 TA - American Journal of Neuroradiology PG - 497--500 VI - 14 IP - 2 4099 - http://www.ajnr.org/content/14/2/497.short 4100 - http://www.ajnr.org/content/14/2/497.full SO - Am. J. Neuroradiol.1993 Mar 01; 14 AB - The authors sought to determine whether there are any heating effects of 1.5-T MR scanning upon nickel-chromium electrodes and to confirm the safety of scanning these electrodes after intracranial surgical implantation in epilepsy patients. Since there was no significant temperature increase of the electrodes tested in their experiments, the authors conclude that nickel-chromium electrodes implanted in the brain are thermally safe for MR scanning.